Design Overview for dynadisp_test

PropertyValue
Project Name:e:\hdl\fndisework\spartan3_starter_kit\dynadisp_test\dynadisp_test
Target Device:xc3s200
Report Generated:Wednesday 10/26/05 at 16:35
Printable Summary (View as HTML)dynadisp_test_summary.html

Device Utilization Summary

Logic UtilizationUsedAvailableUtilizationNote(s)
Number of Slice Flip Flops:223,8401% 
Number of 4 input LUTs:383,8401% 
Logic Distribution:    
Number of occupied Slices:261,9201% 
Number of Slices containing only related logic:2626100% 
Number of Slices containing unrelated logic:0260% 
Total Number 4 input LUTs:443,8401% 
Number used as logic:38   
Number used as a route-thru:6   
Number of bonded IOBs:1917310% 
Number of GCLKs:1812% 

Performance Summary

PropertyValue
Final Timing Score:0
Number of Unrouted Signals:All signals are completely routed.
Number of Failing Constraints:0

Failing Constraints

Constraint(s)RequestedActualLogic Levels
All Constraints Met   

Detailed Reports

Report NameStatusLast Date Modified
Synthesis ReportCurrentWednesday 10/26/05 at 16:35
Translation ReportCurrentWednesday 10/26/05 at 16:35
Map ReportCurrentWednesday 10/26/05 at 16:35
Pad ReportCurrentWednesday 10/26/05 at 16:35
Place and Route ReportCurrentWednesday 10/26/05 at 16:35
Post Place and Route Static Timing ReportCurrentWednesday 10/26/05 at 16:35
Bitgen ReportCurrentWednesday 10/26/05 at 16:35